Test Development Engineer with nearly 2 years of experience in semiconductor product testing and solution development. Proven track record in improving production test yield, reducing false retest rates (FRR), test time reduction (TTR), and solving recurring test issues through automation and innovation. Experienced in device test solution conversion and developing in-house debugging tools using C/C++, C#, Python. Seeking to leverage technical expertise and process optimization skills in an IC test development engineering role.