Jun 2016 - Present
-Develop a universal IoT testing system with modularized test scripts that can be flexibly invoked based on product requirements, simplifying the development process and reducing IoT product development time by 70% and testing time by 30%.
-To achieve IoT product testing automation, we developed control programs for various testing instruments, successfully implementing seven control solutions. This innovation optimized the testing process, significantly improving efficiency and reducing testing time by 50%.
-To boost R&D efficiency and reduce manpower, I led five automation projects covering document processing, data analysis, and test instrument control. These initiatives cut processing time by 75%, reduced manpower by 50%, and lowered labor costs by 50%, significantly improving overall efficiency.
-To achieve EMC test automation, I developed a fully automated EMC testing system by integrating robotic arms, electromagnetic equipment, and image recognition technology. This system enabled continuous testing throughout the day, reducing test time by 50% and improving accuracy by 30%.
-To enhance the AI training efficiency in the factory AOI testing system, I led a team of three members to develop an AI model training system for AOI. The system includes features such as annotation, version control, and model training. This solution reduced AI training and deployment time by 70%.
-To meet customer requirements for tracking AI production history, I developed dozens of PostgreSQL backend APIs, enabling the factory SFIS system to quickly query AI production data at each stage. This initiative reduced NTF issue analysis time by 50%.
-To enhance the operational efficiency of five AI servers storing AI AOI data, I analyzed daily maintenance tasks and developed 12 automated server management programs. These solutions streamlined workflows, reduced manual effort, and cut maintenance time and labor by 50%.